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Awards

DesignVision Award Finalist 2010 FEB
2010

DesignVision Award Finalist 2010
International Engineering Consortium

 

BERTScope® Si 25000C Signal Integrity Analyzer and
CR 25000A Clock Recovery Instrument

DesignVision Award Winner 2009 FEB
2009
DesignVision Award Winner 2009
International Engineering Consortium
  BERTScope® DPP
Digital Pre-Emphasis Processor
DesignVision Award Finalist 2008

JAN
2008

DesignVision Award Finalist 2008
International Engineering Consortium
  BERTScope® PLA
Phase Locked Loop Analyzer
Best in Test Honorable Mention 2008 JAN
2008
Best in Test Product Award 2008
Honorable Mention

Test & Measurement World
  PCIe® Test Bench by BERTScope®
2006 DesignVision Award

FEB
2006

2006 DesignVision Award Winner
International Engineering Consortium
 

BERTScope® CR 12500A
Clock Recovery Instrument

EDN Innovation Award Finalist 2005

FEB
2006

EDN Innovation Award Finalist 2005
Engineering Design News

 

BERTScope® CR 12500A
Clock Recovery Instrument

Best in Test Award Honorable Mention 2006

DEC
2005

Best in Test Product Award 2006 –
Honorable Mention

Test & Measurement World

 

BERTScope® CR 12500A
Clock Recovery Instrument

Frost & Sullivan Innovation Award

DEC
2005

Product Differentiation Innovation Award
Frost & Sullivan

 

BERTScope® S 12500A
Signal Integrity Analyzer
with Stressed Eye Capability

NSDC Best Supporting Solution 2005

OCT
2005

Best Supporting Solution
Network Systems Design Conference

 

BERTScope® S 12500A
Signal Integrity Analyzer
with Stressed Eye Capability

DesignVision Award Winner 2005

FEB
2005

DesignVision Award Finalist 2005
International Engineering Consortium

 

BERTScope® 12500A
Signal Integrity Analyzer

EDN Innovation Award 2004

JAN
2005

EDN Innovation Award Finalist 2004
Engineering Design News

 

BERTScope® 12500A
Signal Integrity Analyzer


IEC DesignVision Award Finalist 2010
BERTScope® Si 25000C 26 Gb/s Signal Integrity Analyzer and
CR 25000A 26 Gb/s Clock Recovery Instrument

DesignVision Award Finalist 2010CHICAGO – January 11, 2010 – The International Engineering Consortium today announced the finalists of its 2010 DesignVision Awards program naming the design tools and products judged as the most unique and beneficial to the semiconductor industry.

The finalists were selected by the DesignCon 2010 Technical Program Committee, consisting of industry experts in the semiconductor and electronic design engineering community.

"We are very proud to honor the work of individuals and companies who have shown outstanding commitment to advancing the electronic design and semiconductor industry with the DesignVision Awards," stated IEC President John R. Janowiak. "We also thank the members of the Technical Program Committee for judging the exceptional submissions received this year."

The 2010 award finalists include:

Test and Measurement Equipment:
SyntheSys Research, Inc.: BERTScope Si 25000C & CR 25000A

››Read IEC's Press Release

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IEC DesignVision Award Winner 2009
BERTScope® DPP Digital Pre-Emphasis Processor

DesignVision Award Winner 2009February 3, 2009: IEC Honors Winners of 2009 DesignVision Awards Today at DesignCon in Santa Clara
The International Engineering Consortium (IEC) gave tribute to the top electronic design innovations of the year in front of hundreds of industry professionals at DesignCon 2009. The DesignVision Awards program celebrates the premiere design tools and products judged as the most unique and beneficial to the semiconductor industry.

“We were pleased to honor SyntheSys Research this afternoon for its BERTScope DPP as a winner of the DesignVision Awards at DesignCon 2009,” commented IEC Executive Vice President Roger Plummer. “We applaud them as some of the ‘BRIGHTEST Minds in Electronic Design,’ which is what we themed this year’s event.”

Test and Measurement Equipment:
SyntheSys Research, Inc.: BERTScope DPP 12500A-4T

››Read IEC's Press Release

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IEC DesignVision Award Finalist 2008:
BERTScope® PLA Phase Locked Loop Analyzer

DesignVision Award Finalist 2008January 7, 2008: The BERTScope PLA Phase Locked Loop Analyzer was honored as a finalist of the 2008 DesignVision Awards in the Test and Measurement Equipment category.

IEC President John Janowiak commented, “It’s a pleasure to distinguish these innovators and top products for the design engineering community. We’re grateful to all participants of this year’s DesignVision Awards program, for its design teams and companies like these that are committed to the successful technology advancement that drive all industries forward.”

Finalists were chosen from a record number of competing products by a panel of judges selected from the 2008 DesignCon Technical Program Committee.

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Best in Test Product Awards 2008 – Honorable Mention:
PCIe® Test Bench by BERTScope®

Test & Measurement World: 
				Best in Test Honorable Mention 2008Test & Measurement World, December 2007

Each year, Test & Measurement World's editors present the Best in Test awards to products we think are particularly innovative or useful.

The following are the products we chose as 2008 Honorable Mentions. T&MW's editors narrowed this year's field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2006, and October 31, 2007…

Test and Measurement Equipment:
PCIe® Test Bench by BERTScope® compliance tester

The PCIe Test Bench by BERTScope provides the equipment and accessories necessary for performing PCI Express transmitter and receiver physical-layer compliance testing at 2.5 GT/s and 5 GT/s rates. The Test Bench includes a new model BERTScope signal integrity analyzer and a BERTScope CRJ clock recovery and jitter analyzer. In addition to being able to generate a 5 GT/s stressed eye signal using built-in jitter sources, the tester enables the measurement of jitter spectrum to PCIe requirements and allows complete characterization of the 100 MHz clock signal. The Test Bench is available with bit rate coverage of up to 7.5 Gbps, or optionally 12.5 Gbps.

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IEC DesignVision Award Winner 2006:
BERTScope® CR 12500A Clock Recovery Instrument

DesignVision Award Winner 2006The BERTScope® S Clock Recovery Instrument from SyntheSys Research has been chosen a Winner of the IEC DesignVision Award.

Honoring innovative contributions to progress in the design engineering industry, the International Engineering Consortium (IEC) announced the DesignVision Award winners at DesignCon 2006 ... Dr. Barry Sullivan, DesignCon 2006 Program Director, commented, “The DesignVision Awards recognize innovative products and services that support the work of electronic design engineers ... The IEC is pleased to provide this recognition to companies whose products exemplify our standard of service to the industry.”

››Read our press release

››Read IEC's press release

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EDN Innovation Awards Finalist 2005:
BERTScope® CR 12500A Clock Recovery Instrument

EDN Innovation Award Finalist 2005February 8, 2006 — The EDN editors have chosen the finalists for their EDN Innovation Awards, to honor outstanding engineering professionals and products. The Innovation of the Year awards recognize unique, state-of-the-art electronics products in several categories...

The EDN Innovation Awards carry special meaning because the winners are chosen by a jury of their peers. After an open nomination period, a panel of EDN editors selects finalists in each category. Then EDN's audience of engineering professionals votes to select the final winners using an online ballot.

EDN Innovation Award Finalist:
Test & Measurement - Application Specific Category
BERTScope® CR 12500A Clock Recovery Instrument

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Best in Test Product Awards 2006 – Honorable Mention:
BERTScope® CR 12500A Clock Recovery Instrument

Test & Measurement World, December 2005

Test & Measurement World: Best in Test Honorable Mention 2006Each year, Test & Measurement World's editors present the Best in Test awards to products they think are particularly innovative or useful. The BERTScope CR 12500A was chosen as a 2006 Honorable Mention. T&MW's editors narrowed this year's field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2004 and October 31, 2005.

Intended for compliance testing of communication designs, the BERTScope CR 12500A clock recovery instrument measures and displays the PLL frequency response from 20 kHz to 12 MHz, which is the widest loop bandwidth available for jitter testing on the market today. The CR 12500A also allows full control of key parameters, including loop bandwidth, peaking/damping, and roll off. You can recover full rate clocks — including spread-spectrum clocks used in Serial ATA (SATA), Serial Attached SCSI (SAS), PCI Express, and Fully Buffered DIMM (FB-DIMM) applications — for signals at data rates from 150 Mb/s to 12.5 Gb/s.

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Frost & Sullivan Product Differentiation Innovation Award 2005
BERTScope® S 12500A Signal Integrity Analyzer with Stressed Eye Capability

Frost & Sullivan Product Differentiation Innovation Award 2005Frost & Sullivan’s recent analysis of the World Cable Testers, BERTs, and ATM Test Equipment selected SyntheSys Research, Inc. as the recipient of the 2005 Product Differentiation Innovation Award in the bit error rate tester/block error rate tester (BERT/BLERT) market. Its inventive tester, the BERTScope™, is a combination of an oscilloscope and a BERT.

Frost & Sullivan Awards are presented to companies in recognition of making an outstanding contribution to their respective industry or achieving a competitive or customer-based leading position in the market.

››Read our press release

››Read Frost & Sullivan's Award Newsletter

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Network Systems Design Conference Best Supporting Solution 2005
BERTScope® S 12500A Signal Integrity Analyzer with Stressed Eye Capability

NSDC Best Solution Award 2005

"...the challenge of testing and verifying high-speed data streams has been met by the BERTScope signal analyzer"
—Dave Bursky, Editor-at-Large for Electronic Design Magazine

SAN JOSE, Calif., Oct. 19, 2005 /PRNewswire/ — The judges' eyes were on innovation and the potential market impact as they selected this year's recipients of the NSDC Best of Show awards. On Wednesday, Oct. 19, the Network Systems Design Conference handed out its fourth annual Best of Show Awards during a ceremony in the Exhibition Hall of San Jose's Parkside Hall. Entries were judged on product innovation, overall technology and potential market impact. This year's awards recipients included SyntheSys Research's BERTScope S as Best Supporting Solution.

Judges for this year's awards included Linley Gwennap, principal analyst for The Linley Group, Bob Wheeler, analyst for The Linley Group, Dave Bursky, Editor-at-Large for Electronic Design Magazine and Craig Matsumoto, senior editor for Light Reading.

"Often overlooked, the challenge of testing and verifying the high-speed data streams has been met by the BERTScope signal analyzer developed by SyntheSys Research," said Dave Bursky, Editor-at-Large for Electronic Design Magazine. "It offers an impressive set of features that let designers perform deep physical-layer analysis and capture rare physical events that traditional oscilloscopes cannot capture."

The Network Systems Design Conference attracts attendees from the following specialties: network systems design hardware and software vendors; design services distributors, consultants and integrators; network equipment makers and other industry leaders and influencers.

››Read our press release

››Read the NSDC press release

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2005 IEC DesignVision Award Finalist
BERTScope® S 12500A Signal Integrity Analyzer with Stressed Eye Capability

DesignVision Award Finalist 2005The International Engineering Consortium (IEC) selected the BERTScope 12500A as a Finalist for the 2005 DesignVision Award, in the category of Test & Measurement.

The DesignVision Awards program recognizes the technologies, applications, products, and services judged to be the most unique and beneficial to the industry.

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EDN Innovation Award Finalist 2004
BERTScope® S 12500A Signal Integrity Analyzer with Stressed Eye Capability

EDN Innovation Award Finalist 2004The BERTScope 12500A was chosen as an EDN Innovation Award Finalist in 2004.

This exclusive awards program honors outstanding electronic products, ranging from integrated circuits to test equipment, and the creative engineers who invent them. The editors of EDN magazine, the premier design publication for electrical engineers, select the finalists from a field of hundreds of candidates. EDN readers then chose the winners from sixteen product categories via an on-line ballot.

››Read our press release



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