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Awards
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IEC DesignVision Award Finalist 2010
The finalists were selected by the DesignCon 2010 Technical Program Committee, consisting of industry experts in the semiconductor and electronic design engineering community. "We are very proud to honor the work of individuals and companies who have shown outstanding commitment to advancing the electronic design and semiconductor industry with the DesignVision Awards," stated IEC President John R. Janowiak. "We also thank the members of the Technical Program Committee for judging the exceptional submissions received this year." The 2010 award finalists include: Test and Measurement Equipment:
IEC DesignVision Award Winner 2009
“We were pleased to honor SyntheSys Research this afternoon for its BERTScope DPP as a winner of the DesignVision Awards at DesignCon 2009,” commented IEC Executive Vice President Roger Plummer. “We applaud them as some of the ‘BRIGHTEST Minds in Electronic Design,’ which is what we themed this year’s event.” Test and Measurement Equipment:
IEC DesignVision Award Finalist 2008:
IEC President John Janowiak commented, “It’s a pleasure to distinguish these innovators and top products for the design engineering community. We’re grateful to all participants of this year’s DesignVision Awards program, for its design teams and companies like these that are committed to the successful technology advancement that drive all industries forward.” Finalists were chosen from a record number of competing products by a panel of judges selected from the 2008 DesignCon Technical Program Committee.
Best in Test Product Awards 2008 – Honorable Mention:
Each year, Test & Measurement World's editors present the Best in Test awards to products we think are particularly innovative or useful. The following are the products we chose as 2008 Honorable Mentions. T&MW's editors narrowed this year's field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2006, and October 31, 2007… Test and Measurement Equipment:
The PCIe Test Bench by BERTScope provides the equipment and accessories necessary for performing PCI Express transmitter and receiver physical-layer compliance testing at 2.5 GT/s and 5 GT/s rates. The Test Bench includes a new model BERTScope signal integrity analyzer and a BERTScope CRJ clock recovery and jitter analyzer. In addition to being able to generate a 5 GT/s stressed eye signal using built-in jitter sources, the tester enables the measurement of jitter spectrum to PCIe requirements and allows complete characterization of the 100 MHz clock signal. The Test Bench is available with bit rate coverage of up to 7.5 Gbps, or optionally 12.5 Gbps.
BERTScope® CR 12500A Clock Recovery Instrument
Honoring innovative contributions to progress in the design engineering industry, the International Engineering Consortium (IEC) announced the DesignVision Award winners at DesignCon 2006 ... Dr. Barry Sullivan, DesignCon 2006 Program Director, commented, “The DesignVision Awards recognize innovative products and services that support the work of electronic design engineers ... The IEC is pleased to provide this recognition to companies whose products exemplify our standard of service to the industry.”
BERTScope® CR 12500A Clock Recovery Instrument The EDN Innovation Awards carry special meaning because the winners are chosen by a jury of their peers. After an open nomination period, a panel of EDN editors selects finalists in each category. Then EDN's audience of engineering professionals votes to select the final winners using an online ballot. EDN Innovation Award Finalist:
Best in Test Product Awards 2006 – Honorable Mention:
Test & Measurement World, December 2005
Intended for compliance testing of communication designs, the BERTScope CR 12500A clock recovery instrument measures and displays the PLL frequency response from 20 kHz to 12 MHz, which is the widest loop bandwidth available for jitter testing on the market today. The CR 12500A also allows full control of key parameters, including loop bandwidth, peaking/damping, and roll off. You can recover full rate clocks — including spread-spectrum clocks used in Serial ATA (SATA), Serial Attached SCSI (SAS), PCI Express, and Fully Buffered DIMM (FB-DIMM) applications — for signals at data rates from 150 Mb/s to 12.5 Gb/s.
Frost & Sullivan Product Differentiation Innovation Award 2005
Frost & Sullivan Awards are presented to companies in recognition of making an outstanding contribution to their respective industry or achieving a competitive or customer-based leading position in the market. ››Read Frost & Sullivan's Award Newsletter
Network Systems Design Conference Best Supporting Solution 2005
SAN JOSE, Calif., Oct. 19, 2005 /PRNewswire/ — The judges' eyes were on innovation and the potential market impact as they selected this year's recipients of the NSDC Best of Show awards. On Wednesday, Oct. 19, the Network Systems Design Conference handed out its fourth annual Best of Show Awards during a ceremony in the Exhibition Hall of San Jose's Parkside Hall. Entries were judged on product innovation, overall technology and potential market impact. This year's awards recipients included SyntheSys Research's BERTScope S as Best Supporting Solution. Judges for this year's awards included Linley Gwennap, principal analyst for The Linley Group, Bob Wheeler, analyst for The Linley Group, Dave Bursky, Editor-at-Large for Electronic Design Magazine and Craig Matsumoto, senior editor for Light Reading. "Often overlooked, the challenge of testing and verifying the high-speed data streams has been met by the BERTScope signal analyzer developed by SyntheSys Research," said Dave Bursky, Editor-at-Large for Electronic Design Magazine. "It offers an impressive set of features that let designers perform deep physical-layer analysis and capture rare physical events that traditional oscilloscopes cannot capture." The Network Systems Design Conference attracts attendees from the following specialties: network systems design hardware and software vendors; design services distributors, consultants and integrators; network equipment makers and other industry leaders and influencers.
2005 IEC DesignVision Award Finalist
The DesignVision Awards program recognizes the technologies, applications, products, and services judged to be the most unique and beneficial to the industry.
EDN Innovation Award Finalist 2004
This exclusive awards program honors outstanding electronic products, ranging from integrated circuits to test equipment, and the creative engineers who invent them. The editors of EDN magazine, the premier design publication for electrical engineers, select the finalists from a field of hundreds of candidates. EDN readers then chose the winners from sixteen product categories via an on-line ballot. |
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The BERTScope® S
Clock Recovery Instrument
from SyntheSys Research has been chosen a Winner of the IEC DesignVision Award.
The International Engineering Consortium (IEC) selected the BERTScope
12500A as a Finalist for the 2005 DesignVision Award, in the category of Test & Measurement.
