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Press Releases |
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Tradeshows & Events |
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Awards |
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Resources |
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eNewsletter |
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Awards
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JAN |
Design Vision 2008
Award Finalist International Engineering Consortium |
BERTScope™ PLA Phase Locked Loop Analyzer |
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JAN 2008 |
Best
in Test Product Award 2008 – Honorable Mention Test & Measurement World |
PCIe Test Bench by BERTScope™ | |
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Design Vision 2006 Award Winner International Engineering Consortium |
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FEB |
EDN Innovation Award Finalist 2005 |
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DEC |
Best in Test Product Award 2006 – |
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DEC |
Product Differentiation Innovation Award |
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BERTScope™ S 12500A |
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OCT |
Best Supporting Solution |
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BERTScope™ S 12500A |
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FEB |
Design Vision 2005 Award Winner |
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JAN |
EDN Innovation Award
Finalist 2004 |
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| IEC DesignVision
Award Finalist 2008: BERTScope™ PLA Phase Locked Loop Analyzer |
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January 7, 2008 : The BERTScope PLA Phase Locked Loop Analyzer was honored as a finalist of the 2008 Design Vision Awards in the Test and Measurement Equipment category. IEC President John Janowiak commented, “It’s a pleasure to distinguish these innovators and top products for the design engineering community. We’re grateful to all participants of this year’s DesignVision Awards program, for it's design teams and companies like these that are committed to the successful technology advancement that drive all industries forward.” Finalists were chosen from a record number of competing products by a panel of judges selected from the 2008 DesignCon Technical Program Committee. |
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Best in Test Product Awards 2008 – Honorable Mention: |
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| Test & Measurement World, December 2007 Each year, Test & Measurement World's editors present the Best in Test awards to products we think are particularly innovative or useful. The following are the products we chose
as 2008 Honorable Mentions. T&MW's editors narrowed
this year's field from scores of deserving products, nominated
by vendors, that were introduced between November 1, 2006, and
October 31, 2007. The PCIe Test Bench provides the equipment and accessories necessary for performing PCI Express transmitter and receiver physical-layer compliance testing at 2.5-Gtransfers/s and 5-Gtransfers/s rates. Test Bench includes a new model BERTScope signal-integrity analyzer and a BERTScope CRj clock recovery and jitter analyzer. In addition to being able to generate a 5-Gtransfers/s stressed-eye signal using built-in jitter sources, the tester enables the measurement of jitter spectrum to PCIe requirements and allows complete characterization of the 100-MHz clock signal. Test Bench is available with bit rate coverage of up to 7.5 Gbps or optionally 12.5 Gbps.
Link to Test & Measurement World |
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| IEC DesignVision
Award Winner 2006: BERTScope™ CR 12500A Clock Recovery Instrument |
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The BERTScope™ S Clock Recovery Instrument from SyntheSys Research has been chosen a Winner of the IEC DesignVision Award. Honoring innovative contributions to progress in the design engineering industry, the International Engineering Consortium (IEC) announced the DesignVision Award winners at DesignCon 2006 ... Dr. Barry Sullivan, DesignCon 2006 Program Director, commented, “The DesignVision Awards recognize innovative products and services that support the work of electronic design engineers ... The IEC is pleased to provide this recognition to companies whose products exemplify our standard of service to the industry.” ››Read IEC's press release |
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EDN Innovation Awards Finalist 2005: BERTScope™ CR / CR HS 12500A Clock Recovery Instruments |
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| February 8, 2006 — The EDN editors have
chosen the finalists for their EDN Innovation Awards, to honor
outstanding engineering professionals and products. The Innovation of
the Year awards recognize unique, state-of-the-art electronics products
in several categories...
The EDN Innovation Awards carry special meaning because the winners are chosen by a jury of their peers. After an open nomination period, a panel of EDN editors selects finalists in each category. Then EDN's audience of engineering professionals votes to select the final winners using an online ballot. EDN Innovation Award Finalist:
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Best in Test Product Awards 2006 – Honorable
Mention: BERTScope CR 12500A Clock Recovery Instrument |
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Test & Measurement World, December 2005 Each year, Test & Measurement World's editors present the Best in Test awards to products they think are particularly innovative or useful. The BERTScope CR 12500A was chosen as a 2006 Honorable Mention. T&MW's editors narrowed this year's field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2004, and October 31, 2005. Intended for compliance testing of communication designs, the BERTScope CR 12500A clock recovery instrument measures and displays the PLL frequency response from 20 kHz to 12 MHz, which is the widest loop bandwidth available for jitter testing on the market today. The CR 12500A also allows full control of key parameters, including loop bandwidth, peaking/damping, and roll off. You can recover full rate clocks — including spread-spectrum clocks used in Serial ATA (SATA), Serial Attached SCSI (SAS), PCI Express, and Fully Buffered DIMM (FB-DIMM) applications — for signals at data rates from 150 Mb/s to 12.5 Gb/s.
Link to Test & Measurement World |
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Frost & Sullivan Product Differentiation Innovation Award 2005 BERTScope™ S 12500A Signal Integrity Analyzer with Stressed Eye Capability |
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| Frost & Sullivan’s
recent analysis of the World Cable Testers, Testers, BERTs, and ATM Test Equipment
selected SyntheSys Research, Inc. as the recipient of the 2005 Product Differentiation
Innovation Award in the bit error rate tester/block error rate tester (BERT/BLERT) market.
Its inventive tester, the BERTScope™, is a combination of an
scilloscope and a BERT.
Frost & Sullivan Awards are presented to companies in recognition of making an outstanding contribution to their respective industry or achieving a competitive or customer-based leading position in the market. ››Read Frost & Sullivan's Award Newsletter
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Network Systems Design Conference Best Supporting Solution 2005 |
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SAN JOSE, Calif., Oct. 19, 2005 /PRNewswire/ — The judges' eyes were on innovation and the potential market impact as they selected this year's recipients of the NSDC Best of Show awards. On Wednesday, Oct. 19, the Network Systems Design Conference handed out its fourth annual Best of Show Awards during a ceremony in the Exhibition Hall of San Jose's Parkside Hall. Entries were judged on product innovation, overall technology and potential market impact. This year's awards recipients included SyntheSys Research's BERTScope S as Best Supporting Solution. Judges for this year's awards included Linley Gwennap, principal analyst for The Linley Group, Bob Wheeler, analyst for The Linley Group, Dave Bursky, Editor-at-Large for Electronic Design Magazine and Craig Matsumoto, senior editor for Light Reading. "Often overlooked, the challenge of testing and verifying the high-speed data streams has been met by the BERTScope signal analyzer developed by SyntheSys Research," said Dave Bursky, Editor-at-Large for Electronic Design Magazine. "It offers an impressive set of features that let designers perform deep physical-layer analysis and capture rare physical events that traditional oscilloscopes cannot capture." The Network Systems Design Conference attracts attendees from the following specialties: network systems design hardware and software vendors; design services distributors, consultants and integrators; network equipment makers and other industry leaders and influencers.
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IEC
DesignVision Award 2005 |
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The BERTScope 12500A received the DesignVision Award, in the category of Test & Measurement, from the International Engineering Consortium (IEC) in February 2005. The DesignVision Awards program recognizes the technologies, applications, products, and services judged to be the most unique and beneficial to the industry.
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EDN Innovation Award Finalist 2004 |
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The BERTScope 12500A was chosen as an EDN Innovation Award Finalist in 2004. This exclusive awards program honors outstanding electronic products, ranging from integrated circuits to test equipment, and the creative engineers who invent them. The editors of EDN magazine, the premier design publication for electrical engineers, select the finalists from a field of hundreds of candidates. EDN readers then chose the winners from sixteen product categories via an on-line ballot.
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