Press Releases

BERTScope™ Approved Test Solution for DisplayPort™ Source (Transmitter) and Sink (Receiver) PHY Testing

March 27, 2008 – Menlo Park, CA – SyntheSys Research, Inc. is pleased to announce that their BERTScope 12500A/7500A analyzer and BERTScope CR12500 Clock Recovery instrument products have been qualified for use as Authorized Test Tools for DisplayPort™ Certified Logo Compliance programs for both Source (transmitter) and Sink (receiver) PHY testing. The BERTScope is the first to be qualified for Sink (receiver) compliance testing… ››Read More (PDF, 66 kB)

BERTScope LTS 8500A - First Receiver Test Solution Optimized for 8x Fibre Channel and 10GBASE-SR Enables SFP+ and XFP Test Verification

February 25, 2008 – MENLO PARK, CA – SyntheSys Research, Inc., introduces the new BERTScope Lightwave Test Set (LTS) 8500A – the first flexible stress solution to offer 850 nm receiver jitter tolerance testing (stressed eye) to 8x Fibre Channel and 10 Gb/s Ethernet Short Reach (10GBASE-SR) standards for transceiver types such as XFP and SFP+. In combination with the BERTScope S 12500B signal integrity analyzer, the LTS 8500A offers compliance test and deep insight on all high speed ports of common short reach optical transceivers… ››Read More (PDF, 79 kB)

First Instrument-Grade 3-Tap Pre-Emphasis Solution For 10GBASE-KR, 8 GT/s PCIe, SAS, and Other Key Gb/s Serial Data Standards

February 6, 2008 – MENLO PARK, CA, – SyntheSys Research, Inc., introduces the new BERTScope Digital Pre-Emphasis Processor (BERTScope DPP) – the first 12.5 Gb/s instrument solution capable of programmable three-tap pre-emphasis for compliance testing to standards such as 802.3ap (10 Gigabit Ethernet over the Backplane, also known as 10GBASE-KR), Serial Attached SCSI (SAS), and flexible enough for the next generation 8 GT/s PCI Express® standard under development… ››Read More (PDF, 786 kB)

First Complete PCI Express Compliance Solution for Testing Transmitters, Receivers at 2.5 GT/s and 5.0 GT/s

October 15, 2007 – MENLO PARK, CA – SyntheSys Research, Inc., introduces the new PCIe Test Bench by BERTScope, the first complete solution for PCI Express® transmitter and receiver physical layer compliance testing at 2.5 and 5.0 GT/s rates ... The PCIe Test Bench provides all equipment and accessories needed to make compliance measurements easy. Built on the innovative BERTScope S signal integrity analyzer platform, new capabilities have been added for 5 GT/s compliance: All jitter elements are built in for receiver test making mandatory receiver tolerance testing simple… ››Read More (PDF, 1.31 MB)

First SONET/SDH/OTN Jitter Compliance Solution Showing
Jitter Spectrum to >80 MHz

September 6, 2007 – MENLO PARK, California – SyntheSys Research, Inc., introduces the new BERTScope™ Digital Communications Receiver with Jitter Analysis (DCRj) -- the first 10 Gb/s telecom jitter solution to test device compliance and show the full 80 MHz spectrum to precisely see and troubleshoot device behavior. Aimed at telecom applications, the DCRj will also be valuable to developers of XFP and SFP+ transceivers… ››Read More (PDF, 126 kB)

First Complete PLL Analyzer Tests PCIe Compliance

August 4, 2007 – MENLO PARK, California – SyntheSys Research, Inc., introduces the new BERTScope PLA series of Phase Locked Loop Analyzers – the first single-instrument solution for validating that the response of PLLs (used for transmitting clock generation in Add-In cards) is compliant to PCI-Express test specifications… ››Read More (PDF, 16 kB)

SyntheSys Research at PCI-SIG Developer's Conference
Demonstrating Gen2 Test Techniques

May 21, 2007, MENLO PARK, California – SyntheSys Research, Inc. … demonstrates new PCIe 2.0 test techniques at the 2007 PCI-SIG Developer's Conference on May 21–22 at the San Jose McEnery Convention Center in San Jose, California. The BERTScope 7500B and the newly released CRJ are the centerpieces of a comprehensive PCIe 2.0 Receiver Tolerence Test solution … [that] generates the five sources of jitter—Low frequency RJ and DJ, High frequency RJ and DJ, plus ISI—meeting the standards with precise jitter sweep capabilities ... A novel PLL Loop Bandwidth Tester technique, compliant with the new 2.0 test requirements, will also be demonstrated… ››Read More (PDF, 23 kB)

SyntheSys Research Announcing New Test Solutions at OFC

March 27, 2007, MENLO PARK, California – SyntheSys Research, Inc. … announces its latest innovations at OFC in Anaheim,CA … Optical Stressed Eye Receiver and Transmitter Testing for SFP+ and XFP … BERTScope CRJ Clock Recovery Jitter Analyzer … ››Read More (PDF, 26 kB)

New BERTScope™ CRJ Clock Recovery Instrument with Jitter
Analysis Capability

January 30, 2007, MENLO PARK, California – SyntheSys Research, Inc. … introduces the new BERTScope CRJ Clock Recovery Instrument with Jitter Analysis capability … used with a BERTScope signal integrity analyzer, the BERTScope CRJ directly measures jitter components from the serial input data while simultaneously generating a recovered clock. The measurements include a spectral analysis of jitter components, along with a direct measure of duty cycle dependent jitter … ››Read More (PDF, 29 kB)

New BERTScope™ S Option SSC :: Spread Spectrum Clock and
Data Generation for PCI-Express, SATA, FB-DIMM, and SAS

January 30, 2007, MENLO PARK, California – SyntheSys Research, Inc. … introduces Spread Spectrum Clock and data generation for the BERTScope S Signal Integrity Instrument Family.

Spread Spectrum Clocking (SSC) is being used by many of the latest high speed serial buses in order to reduce EMI issues in new board and system designs. Data patterns with embedded SSC and SSC full and sub-rate clocks are needed in order to fully test and characterize ICs and boards in systems using SSC … ››Read More (PDF, 33 kB)

New BERTScope™ S Eye Openers :: De-Emphasis Accessories for
PCI-Express, SATA, and FB-DIMM

January 30, 2007, MENLO PARK, California – SyntheSys Research, Inc. ... introduces BERTScope Eye Openers for the convenient and easy-to-use conversion of conventional non-return to zero (NRZ) data to de-emphasized data signals, which are used by a growing number of high speed serial bus standards … Models [are] available for PCIe, SATA, and FB-DIMM…
››Read More (PDF, 131 kB)

New Clock Recovery Instrument from Tektronix for High Speed Electrical Serial Data Testing

Tektronix 80A07 Based upon BERTScope™ CR Technology Provided by SyntheSys Research Advances Serial Data Characterization and Compliance Testing

January 29, 2007, BEAVERTON, Oregon – Tektronix, Inc. (NYSE: TEK), a leading worldwide provider of test, measurement and monitoring instrumentation, announced that the company has entered into an OEM agreement with SyntheSys Research to offer an advanced clock recovery instrument. Marketed as the Tektronix 80A07 BERTScope CR, this instrument provides highly flexible clock recovery capabilities for stressed or degraded signals, and is designed to make compliance testing of today’s high speed serial data designs easy and accurate … ››Read More (PDF, 37 kB)

New Capabilities for PCI Express, SATA, and SAS Serial Bus Testing
The Latest Additions to the BERTScope™ Family

October 24, 2006 – MENLO PARK, California – SyntheSys Research, a developer and manufacturer of high-speed signal integrity test and measurement solutions for the computer, storage, and communications industries, introduces the new BERTScope "B" family of products for testing from 0.1 to 12.5 Gb/s … Design engineers testing to the latest PCI Express, Serial-ATA, Serial Attached SCSI and Fully Buffered DIMM standards can utilize the new BERTScope S 7500B and S 12500B capabilities for accurate compliance testing … ››Read More (PDF, 133 kB)

New BERTScope Stressed Pattern Generator
Calibrated Stressed Data Generation at Flexible Bit Rates

August 28, 2006 – MENLO PARK, California – SyntheSys Research, a developer and manufacturer of high-speed signal integrity test and measurement solutions for the computer, storage, and communications industries, introduces the new BERTScope S Pattern Generator … generate calibrated, stressed data for jitter tolerance testing when either the device under test or a legacy BERT are used to measure bit error ratio. With very flexible clocking capabilities from 0.1 to 12.5 Gb/s, it can also stress an external clock, including spread spectrum clocks (SSC) for serial bus testing … ››Read more (PDF, 32 kB)

Innovative BERTScope™ ISI Board for Stress Testing Flexible and Cost-Effective Inter-Symbol Interference (ISI) Solution Now Available

March 9, 2006 – MENLO PARK, California – SyntheSys Research, Inc., manufacturer of the BERTScope family of products, introduces the BERTScope ISI Board that is specifically designed to provide a low-cost, highly accurate method of introducing controlled amounts of ISI for stress testing and general lab use, where emulation and measurement of data transmitted through a backplane or other circuit board are required … ››Read more (PDF, 37 kB)

Automated Optical Stressed Eye Compliance Testing Now Available —
New BERTScope™ Software Optimizes Key Parameters and is Bit Rate Flexible

March 8, 2006 – MENLO PARK, California – SyntheSys Research, manufacturer of the BERTScope family of products, introduces BERTScope Optical Stress Compliance software that can construct a calibrated optical stressed eye, then automate testing with it … The stressed eye signal is produced by a BERTScope S and JDSU OPTX10 Optical Transmitter … the setup also uses a Picometrix Reference Receiver. The software controls the BERTScope S and JDSU OPTX10 and optimizes the signal produced, looking at the optical signal out of the OPTX10 using the Picometrix/BERTScope S, and adjusts the transmission parameters to see the effect on the analyzer … ››Read More (PDF, 38 kB)

Fully Compliant Clock Recovery for Optical Communications Test

March 7 , 2006 – MENLO PARK, California – The award-winning BERTScope CR 12500A Clock Recovery instrument (www.clockrecovery.com) is ideal for recovering compliant clocks required in the latest optical communications standards including 10G Ethernet, 1X, 2X, 4X, 8X, and 10X Fibre Channel, OIF CEI, XFP, and SONET. The CR 12500A’s highly advanced architecture measures and displays the PLL frequency response from 100 kHz to 12 MHz and has the highest continuous loop bandwidth that is essential for jitter testing. It is the first instrument that allows full control of key parameters such as loop bandwidth, peaking/damping, and roll off … ››Read More (PDF, 38 kB)

SyntheSys Research and BERTScope™ – A Winning Combination
BERTScope CR Wins 2006 DesignVision Award

February 8, 2006 – MENLO PARK, California – Today SyntheSys Research announces that its clock recovery instrument — the BERTScope™ CR 12500A — has won the prestigious 2006 DesignVision Award in the Test and Measurement Equipment Category. The CR 12500A’s advanced architecture measures and displays the PLL frequency response from 100 kHz to 12 MHz and has the highest continuous loop bandwidth that is essential for jitter testing. It is also the first instrument that allows full control of key parameters such as loop bandwidth, peaking/damping, and roll off. It can recover clocks from spread spectrum clocked signals (SSC) used in Serial ATA, SAS, PCI Express, and FB DIMM applications. The CR 12500A can be used with the BERTScope S Stress Analyzer and in standalone operation with other BERTs and sampling oscilloscopes … ››Read More (PDF, 36 kB)

BERTScope™ from SyntheSys Research Captures Product Differentiation Award from Frost and Sullivan

December 6 , 2005 — MENLO PARK, California — The BERTScope™ S analyzer has been honored by Frost and Sullivan to receive the 2005 Product Differentiation Award in the BERT test equipment product category ... Introduced in 2004, The BERTScope is a new instrument class, offering the vision of a scope and the confidence of a BERT… ››Read More (PDF, 159 kB)

BERTScope™ S with Live Data Option Wins Best Supporting Solution Award at the Network Systems Design Conference

November 2 , 2005 — MENLO PARK, California — SyntheSys Research, an innovator in high-speed signal integrity test and measurement solutions, won the Best Supporting Solution Award for its BERTScope™ S Analyzer with Live Data Option at the 2005 Network Systems Design Conference ... Entries were judged on product innovation, overall technology, and potential market impact … ››Read More (PDF, 44 kB)

BERTScope™ S offers Compliance Contour for XFP, OIF-CEI,
and PCI Express

June 13, 2005 — MENLO PARK, California — The latest, more rigorous compliance testing standards for computer, storage, enterprise and telecommunications markets require new test and measurement capability up to 10 Gb/s. The BERTScope S addresses test needs for higher speed (in excess of 1 Gb/s) electrical components, serial links, and interfaces for computer memory, busses and back planes, including the FB-DIMM, Serial ATA, and PCI Express II standards. BERTScope S also addresses test needs for electrical and optical storage, enterprise and telecommunications components, transceivers and network equipment, including OIF-CEI and the new 4X Fiber Channel and 10G Ethernet standards.

The new BERTScope S is the first instrument with Compliance Contour, using built-in masks for fast and easy compliance tests, as specified by XFP/XFI and OIF CEI for BER contours of 10^-12. “We are working closely with our customers to bring critical test functionality to market, even before these new standards are fully ratified. BERTScope S gives our customers the competitive edge they need to test their devices and network equipment with confidence in minutes, rather than hours or days … " said Lutz Henckels, CEO … ››Read More (PDF, 180 kB)

SyntheSys Demonstrates Optical Stressed Eye Receiver Testing
up to 10 Gb/s

June 13, 2005 — MENLO PARK, California — For design engineers creating and building the next generation optical storage, enterprise and telecommunications components and network equipment, this demonstration provides the ideal solution for testing to the latest, more rigorous serial data standards, including 4X Fiber Channel and 10G Ethernet … ››Read More (PDF, 148 kB)

Instrument-Grade Clock Recovery Instrument for Jitter Compliance Tests

March 8, 2005 — MENLO PARK, California — Today SyntheSys Research announces the availability of a new member of the BERTScope™ family of Signal Integrity Analysis Tools. The BERTScope CR 12500A is a new fully flexible variable rate clock recovery instrument, designed to make compliance testing of today's communication designs easy and accurate. With jitter being such a complex and contentious parameter, the CR 12500A is intended to make compliance testing simple, repeatable and precise … ››Read More (PDF, 58 kB)

Integrated Stressed Eye from BERTScope™ Verifies Receiver Compliance

March 2, 2005 — MENLO PARK, California — SyntheSys Research will present a new integrated stressed eye generator option for its BERTScope™ analyzer family at OFC in the Anaheim Convention Center, March 8 through 10, 2005 … SyntheSys Research's BERTScopes combine eye diagram analysis, jitter analysis, and BERT (bit error ratio test) pattern generation and error analysis into a single instrument. The new integrated stressed eye option allows the BERTScope to overlay controlled levels of jitter and an adjustable sinusoidal interference signal on top of data patterns … ››Read More (PDF, 164 kB)

New BERTScope Live Data Analysis to be presented at OFC 2005

February 4, 2005 — MENLO PARK, California — SyntheSys Research will present a new Live Data signal integrity analysis option for its BERTScope analyzer family at OFC in the Anaheim Convention Center … Design engineers, signal integrity engineers, and test engineers implementing the latest high speed interfaces such as 4 Gb/s Fibre Channel, Serial-ATA, Serial Attached SCSI, Fully Buffered DIMM, 6 and 11 Gb/s OIF-CEI … ››Read More (PDF, 47 kB)

BERTScope Selected as EDN Award Finalist

January 29, 2005 — MENLO PARK, California — SyntheSys Research announces that the 12.5 Gb/s BERTScope™ signal integrity analyzer has been selected as a finalist for Engineering Design News' ("EDN's") 2004 Innovation Awards.
BERTScopes combine all of the essential signal integrity measurements in one integrated instrument. These include eye diagram analysis, jitter analysis, and BERT (bit error ratio test) pattern generation and error detection… ››Read More (PDF, 25 kB)

Finalists Named in EDN Magazine's Innovation Awards

January 24, 2005 — NEWTON, Massachusetts — EDN Magazine has named the finalists in its 15th annual Innovation Awards; these finalists will now await final judging by their engineering peers … TEST & MEASUREMENT: BERTScope 12500A BER Analyzer, SyntheSys Research … ››Read More (Press Release from EDN, PDF, 25 kB)

New BERTScope Live Data Analysis to be presented at DesignCon 2005

January 26 , 2005 — MENLO PARK, California — SyntheSys Research will present a new Live Data signal integrity analysis option for its BERTScope analyzer family at DesignCon2005 at the Santa Clara Convention Center … Design engineers, signal integrity engineers, and test engineers implementing the latest high speed interfaces such as 4 Gb/s Fibre Channel, Serial-ATA, Serial Attached SCSI, Fully Buffered DIMM, 6 and 11 Gb/s OIF-CEI … ››Read More (PDF, 80 kB)

SyntheSys Research Announces New Stressed Eye Receiver Testing Capability: New capability for testing multi-gigabit receivers is an industry first

November 9, 2004 — ELECTRONICA 2004, Munich — SyntheSys Research Inc., a leading supplier of test and measurement equipment for the data communications, telecommunications and digital TV markets, today announced the industry’s most comprehensive and flexible Stressed Eye jitter solution for testing multi-gigabit serial data receivers, available as a new option for the BERTScope 12500A … ››Read More (PDF, 60 kB)

SyntheSys Research Expands Its European Operations: VP of European Operations appointed; Laser 2000 GmbH established as European distribution partner

November 9, 2004 — ELECTRONICA 2004, Munich — SyntheSys Research Inc., a leading supplier of test and measurement equipment for the data communications, telecommunications and digital TV markets, recently announced the appointment of Chris Sheldon as its Vice President of European Operations to strengthen and increase its market share in Europe.
Coupled with the release of the company’s new and unique 12.5 Gb/s BERTScope product family and the establishment of a distribution network across Europe, SyntheSys Research is now well positioned to respond to the growing demand for its 10 Gb/s solutions in network systems … ››Read More (PDF, 29 kB)

SyntheSys Research, Inc. selects high-speed components from Inphi Corporation for next generation BERTScope™

February 24, 2004 — LOS ANGELES, California — SyntheSys Research, Inc., introduced the new BERTScope™ 12500A and BERTScope™ 7500A at the 2004 Optical Fiber Conference with high-speed technology from Inphi Corporation ... "Our partnership with Inphi has meant ultra high-speed performance with very smooth integration efforts to enable a new best-in-class instrument" … ››Read More (PDF, 75 kB)

Dr. Lutz Henckels joins SyntheSys Research as CEO

February 23, 2004 — MENLO PARK, California — Dr. Lutz P. Henckels has been named director and chief executive officer of SyntheSys Research, Inc. … Henckels was president and CEO of LeCroy Corporation (LCRY) for nine years, taking it public in 1996 and more than tripling its oscilloscope business to $140M during his tenure. Prior to that, Henckels founded HHB Systems Inc., an electronic design automation company … ››Read More (PDF, 76 kB)

SyntheSys Research, Inc. announces the introduction of the first two members of its BERTScope™ family of advanced signal integrity analysis instruments

February 10, 2004 — MENLO PARK, California — SyntheSys Research, Inc., a privately held California corporation, today introduced the BERTScope™ 7500A and 12500A Analyzers designed for applications from 100 Mb/s to 7.5 Gb/s and 12.5 Gb/s, respectively. BERTScopes are the industry's first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern generation and analysis … ››Read More (PDF, 85 kB)

WTT signs licensing agreement with SyntheSys Research, announces new product line

December 9, 2003 — PARSIPPANY, New Jersey — Wireless Telecom Group, Inc. (AMEX Symbol: WTT) announced the development of a new complementary product line today.
Wireless Telecom Group is developing Bit-Error Rate Analyzers under the Noise Com brand name. The new product line will be based on technology licensed from California-based SyntheSys Research … ››Read More (PDF, 76 kB)

MVA3000 awarded PICK OF SHOW at NAB2003

April 9, 2003 — LAS VEGAS, Nevada — The MVA3000 has been awarded the DigitalTV Television Broadcast Editors' Pick of Show award from the editorial team of DigitalTV Television Broadcast magazine. These awards are presented in recognition of innovative achievement in the advancement of the science, art, and business of television. Products or technologies that receive the Pick of Show award are nominated by industry professionals and selected unanimously by the editorial team of DigitalTV Television Broadcast magazine.

SyntheSys Research Introduces MVA3000 Multi-Format Analyzer at NAB2003

April 7, 2003 — LAS VEGAS, Nevada — SyntheSys Research, Inc., the leader in SDI developer tools for high definition and standard definition video signals, will introduce the new MVA3000 Multi-Format Analyzer to attendees at the National Association of Broadcasters show in Las Vegas this week … ››Read More (PDF)

SyntheSys Research Demonstrates Three New Products at CDC02

September 24, 2002 — SAN JOSE, California — SyntheSys Research, Inc., a leading manufacturer of test and measurement equipment providing rapid identification of errors and other problems in high-speed digital data streams for the television and telecommunications market, will demonstrate three new products ... ››Read More (PDF)

SyntheSys Research Demonstrates MVA3000, the Ultimate Multi-Format Video Analysis System, at IBC02

September 13, 2002 — AMSTERDAM, The Netherlands — SyntheSys Research, Inc., the leader in providing advanced digital audio-visual test and measurement equipment for the television and telecommunications markets, today debuted the MVA3000 Multi-Format Video Test System … ››Read More (PDF)

SyntheSys Research Announces Availability of New Application Note for BER Testing for SFI-4

May 22, 2002 — MENLO PARK, California — SyntheSys Research, Inc., a leader in Bit Error Rate Testing technology announces the availability of a new application note on 'Bit Error Rate Testing for SFI-4 Applications' … ››Read More (PDF)

SyntheSys Research Debuts HD292 High Definition Video Test System with Time Code At NAB 2002 :: Extended Features Enable Filmmakers to Verify Digital Signal Quality, and Pinpoint Extensive Information Identifying Any Digital Clip

April 8, 2002 — LAS VEGAS, Nevada — SyntheSys Research, Inc., a leading manufacturer of test and measurement equipment providing rapid error identification in high-speed digital data streams, is introducing the HD292 High Definition Video Test System with Time Code—the most comprehensive combination analysis and generation test system available for high-definition serial digital production. The system solves two key issues in HD production … ››Read More (PDF)

SyntheSys Research, Inc. Introduces the ultimate bit error rate test system, the BitAlyzer® BA1500, featuring data speeds up to 1.5Gbit/sec, Jitter Measurement, Eye Display, Eye Mask Tests, and Error Analysis™ at OFC2002

March 18, 2002 — ANAHEIM, California — SyntheSys Research, Inc., the industry leader in advanced digital analysis test and measurement equipment, will demonstrate the BitAlyzer® BA1500 at OFC2002. This is the world's first multi-function bit error rate-based physical layer test system … ››Read More (PDF)

SyntheSys Research, Inc. Introduces the BitAlyzer® BA14400B: 16 Gbits/sec Parallel Channel BERT with Flexible I/O at OFC2002

March 18, 2002 — ANAHEIM, California — SyntheSys Research, Inc., the industry leader in advanced digital bit error analysis test and measurement equipment, is proud to announce the BitAlyzer® BA14400B, a 16Gbit/sec Parallel Channel Bit Error Rate Test System. This system operates at up to 1000Mbit/sec per channel on 16 channels and is capable of supporting variable amplitude, offset, and logic threshold for both differential and single ended I/O. The BA14400B features adjustable delay for each channel and direct data clocking without the need for a phase lock loop … ››Read More (PDF)

SyntheSys Research, Inc. Demonstrates BitAlyzer® BA1000 and Announces the Launch of their New Website. www.synthesysresearch.com at SMPTE2001

November 4, 2001 — NEW YORK, New York — SyntheSys Research, Inc., the industry leader in advanced digital analysis test and measurement equipment, demonstrates today the BitAlyzer® BA1000 bit error analyzer, which analyzes error rates … ››Read More (PDF)

SyntheSys Research, Inc. Demonstrates BitAlyzer® BA1000 and Announces the Launch of their New Website. www.synthesysresearch.com at the Communications Design Conference 2001

October 1 , 2001 — SAN JOSE, California — SyntheSys Research, Inc., the industry leader in advanced digital analysis test and measurement equipment, demonstrates today the BitAlyzer® BA1000 bit error analyzer, which analyzes error rates ... ››Read More (PDF)

SyntheSys Research, Inc. Demonstrates BitAlyzer® BA1000 and Announces the Launch of their New Website. www.synthesysresearch.com at DiskCon2001

September 19, 2001 — SAN JOSE, California — SyntheSys Research, Inc., the industry leader in advanced digital analysis test and measurement equipment, demonstrates today the BitAlyzer® BA1000 bit error analyzer, which analyzes error rates … ››Read More (PDF)

SyntheSys Research Introduces Next-Generation HD292 High Definition Video Test System at IBC2001

SyntheSys Research Introduces Revised BitAlyzer® Digital Video Analyzer at IBC2001

September 14, 2001—AMSTERDAM, The Netherlands— SyntheSys Research, Inc., the leader in providing advanced digital audio-visual test and measurement equipment for the television and telecommunications markets, today introduced a redesigned version of its best-selling BitAlyzer™ DVA184C Digital Video Test System to the European technology community ... Designed for manufacturing, broadcast, networking and post-production industries ... The system performs comprehensive testing of serial digital interface (SDI) parameters and verifies compliance with SMPTE 259M and 125M, and ITU-R BT.601 and BT.656 standards … ››Read More (PDF)

SyntheSys Research Introduces Advanced HDTV Digital Signal Analysis Systems at NAB 2001

April 23, 2001 — LAS VEGAS, Nevada — SyntheSys Research, Inc., the industry leader in providing advanced digital analysis test and measurement equipment, introduced new digital analysis systems during NAB 2001 for high-definition television, standard-definition video, and telecommunication applications … ››Read More (PDF)

SyntheSys Research Demonstrates Digital Analysis Systems To Fiber Optic Community at OFC

March 19, 2001 — ANAHEIM, California — SyntheSys Research, Inc., the industry leader in advanced digital bit error ratio analysis test and measurement equipment, announced today the introduction of two new digital data analysis systems for fiber optic system manufacturers, developers and researchers during the OFC 2001 conference … ››Read More (PDF)

SyntheSys Research to Demonstrate Advanced High Definition Video Test System at VidTranS

February 26, 2001 — UNIVERSAL CITY, California — SyntheSys Research, Inc., the industry leader in providing advanced digital analysis test and measurement equipment, announced today it will demonstrate two leading-edge digital analysis systems at the VidTranS Conference in Universal City … ››Read More (PDF)

SyntheSys Research Introduces BitAlyzer1000 at ITC 2000: Real Time Bit Error Analysis at 1 Gigabit Per Second

October 23, 2000 — MENLO PARK, California — SyntheSys Research, Inc., the industry leader in advanced digital analysis test and measurement equipment, today announced the release of the BitAlyzer®1000 bit error analyzer, which analyzes error rates in real time at 1 gigabit per second (Gbit/s) … ››Read More (PDF)

SyntheSys Research Demonstrates HDEYE292 High Definition Video Test System At SMPTE2000 Technical Conference

October 18, 2000 — PASADENA, California — SyntheSys Research, Inc., the leader in providing advanced digital audiovisual test and measurement equipment for the television and telecommunications markets, is demonstrating the HDEYE292 High Definition Video Test System–the most comprehensive combination analysis and generation test system available for high-definition serial digital signals (SMPTE292M) … ››Read More (PDF)

SyntheSys Research, Inc. Introduces BitAlyzer®1000 at DiskCon

September 20, 2000 — SAN JOSE, California — SyntheSys Research, Inc., the industry leader in advanced digital analysis test and measurement equipment, announced today the release of the BitAlyzer1000 bit error analyzer, which analyzes error rates in real time at 1 Gigabit per second (Gbit/s) ... ››Read More (PDF)

SyntheSys Research Introduces HDEYE292 High Definition Video Test System AT IBC2000

September 8, 2000 — AMSTERDAM, The Netherlands — SyntheSys Research, Inc., the leader in providing advanced digital audiovisual test and measurement equipment for the television and telecommunications markets, today introduced the HDEYE292 High Definition Video Test System–the most comprehensive combination analysis and generation test system available for high-definition serial digital signals (SMPTE292M) … ››Read More (PDF)

SyntheSys Research, Inc. Expands Its HDTV Offering with HDEYE292 Jitter Analyzer at NAB2000

April 10, 2000 — LAS VEGAS, Nevada — SyntheSys Research, Inc., of Menlo Park, California, has chosen the National Association of Broadcasters show as the launching point for two new products that support the digital television transition going on throughout the world today … ››Read More (PDF)

SyntheSys Research Licenses BitAlyzer Technology to Agilent Technologies, Inc.

February 1, 2000 — MENLO PARK, California — SyntheSys Research has licensed its BitAlyzer® error location analysis technology to Agilent Technologies, Inc., a subsidiary of Hewlett-Packard Company, for use in upcoming high-speed bit error ratio test instruments … ››Read More (PDF)