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CR 12500A & 14300A
Clock Recovery
CRJ Clock Recovery with Jitter Analysis
DCRJ Digital Communications Receiver with Jitter Analysis
PLA Clock PLL Response Analyzer

 

BERTScope CRJ Variable Clock Recovery Jitter Spectrum Analyzer

  RELATED MATERIAL
Download PDF CR 14300A & CRJ 12500A Option 143 Product Brief (PDF)
Download PDF CRJ 12500A Product Brief (PDF)
Download PDF CR 12500A Product Brief (PDF)
Download PDF Signal Integrity Success in Computer and Storage Applications Technical Brief (PDF)
Request posters Request Free "Anatomy of Clock Recovery" posters

Jitter Spectrum and DCD Measurements

The BERTScope™ CRJ Variable Clock Recovery Jitter Analyzer is based on our BERTScope CR, the highest performance instrumentation-grade adjustable clock recovery product available today. The CRJ retains all of the functionality of the current BERTScope CR, with additional Jitter Analysis capabilities:

  • Jitter Spectrum measurements

The jitter spectrum display lets you quickly validate device compliance to serial data standards, such as PCIe 2.0, which specify a total jitter value over a band-limited range of frequency. These measurements are also very useful in isolating the source of excessive jitter in a system.

Jitter Spectrum is a unique tool, in the respect that it is extracted from the signal in the clock recovery circuit. While some sampling oscilloscopes can perform jitter spectrum measurements on repetitive signals, they can not measure jitter at frequencies below the band-pass frequency of the clock recovery loop, as these components are tracked and removed during the sampling process.

  • Duty Cycle Dependent measurements

Clock Recovery Duty Cycle Dependency measurement screenThe BERTScope CRJ also directly measures Duty Cycle Dependent Jitter (DCD). The result appears in the BERTScope CRJ Display with a table of values and a graphical Level Histogram.

DCD Jitter is a required measurement in some serial data standard compliance tests. It is a useful tool in system design, for identifying jitter sources.

CR control on BERTScope analyzerThe BERTScope CRJ can combine with a BERTScope Signal Integrity Analyzer to directly measure jitter components from the serial input data while simultaneously generating a recovered clock. A Jitter Spectrum View in the analyzer's user interface measures spectral analysis of jitter components, along with a direct measure of duty cycle dependent jitter. Results are displayed as a plot of jitter magnitude vs. frequency. The Y-axis of the graph is scaled in %UI or time (ps). The X-axis measures frequency, with a range of 200 Hz to 90 MHz and 100 Hz resolution.

In addition, the BERTScope CRJ operates stand-alone, providing the same unmatched performance with sampling oscilloscopes and other bit error rate test instruments.


Features of the CRJ:  
  • Full BERTScope CR functionality, including compliant clock recovery from 150 Mb/s to 12.5 Gb/s, or to 14.3 Gb/s with Option 143; adjustable, self-measuring loop BW and peaking
     
  • Powerful jitter measurement capability to 12.5 Gb/s
     
  • Direct spectral analysis of jitter components
     
  • ‘Spectrum analyzer’ display with cursor measurements of jitter and frequency
     
  • User-settable frequency gated measurements for band-limited integrated jitter
    • Preset band limits for PCIe 2.0 jitter spectrum
  • Direct measure of Duty Cycle Dependent (DCD) jitter
     
  • Passive ‘Pass through’ signal path — neither timing nor amplitude on input signal are regenerate
     
  • Stand-alone software available for control through a PC.
     
  • Combine with a BERTScope Signal Integrity Analyzer to use the new Jitter Spectrum View included in the analyzer's user interface.
     
     

Ordering Information

Product Code Description
CRJ12500A BERTScope CRJ Variable Clock Recovery Instrument and Jitter Analysis
CRJ12500A-Option 143 BERTScope CRJ Variable Clock Recovery to 14.3 Gb/s with Jitter Analysis to 12.5 Gb/s

Extended warranty and product upgrade options are available. Contact your sales representative for more information.

 

 

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