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Sample-rich eye diagrams are swiftly created using the same multi-gigabit/second
sampling capability as the BER detection circuit. This provides far more complete characterization
of waveform variation with long PRBS or user patterns than existing digital communications
analyzers, which are limited to sampling rates below 250 ksamples/second.
For the first time, eye diagrams give a view of sampled data that
is directly correlated to BER measurements. Now, simply adjusting the BERTScope's decision
threshold to a mask violation and turning on BitAlyzer® Error Location Analysis enables
you to easily determine which specific bit and pattern sequence is responsible for an
eye diagram mask violation, worst case jitter, or slowest rise time.
The BertScope Analyzer with BitAlyzer Error Location Analysis performs
seven types of advanced error analysis. Use patented Pattern Sensitivity and Error Free
Interval Analysis to swiftly identify pattern-dependent and frequency-dependent errors.
Proprietary high-resolution (sub-picosecond), self-calibrating delay lines (patent pending)
enable accurate measurement and separation of jitter into deterministic and random components
through Jitter Peak (jitter bathtub, BERT scan) Analysis, as well as accurate BER Contour
Analysis (again correlated with the sample-rich eye diagram display).
New high-speed serial interfaces like CEI, XFP/XFI, 10 Gb Ethernet,
and both 4 Gb and 10 Gb Fibre Channel are creating new demands for test and detailed
performance analysis. SyntheSys Research BERTScope Analyzers feature true differential
outputs and inputs with variable decision threshold settings, critical for accurate
differential I/O testing and analysis, such as Q-Factor and BER Contour. BERTScopes
reduce required capital investments, by simplifying and speeding test and detailed performance
analysis with built-in sinusoidal jitter generation and jitter tolerance testing together
with integrated stressed eye generation and testing.
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