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BERTScope S Signal Integrity Analyzer with Stressed Eye
BERTScope
Signal Integrity Analyzer
PCIe Test Bench by BERTScope
BERTScope SPG
Stressed Pattern Generator
BitAlyzer 1500
1.5 Gb/s Error Analyzer


 

 

BERTScope User Interface
BERTScope User Interface

The BERTScope User Interface

The BERTScope™ 12500 and 7500 Analyzers are designed for applications from 500 Mb/s to 12.5 Gb/s and 7.5 Gb/s, respectively. BERTScopes are the industry's first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern generation and analysis.

 

RELATED MATERIAL
BERTScope S Product Family Brochure PDF
Technical Specifications PDF
Optical Stressed Eye Test Set Technical Brief (PDF)

Eye Diagram

PatternVu Option

Eye Diagram thumbnail CleanEye

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Sample-rich eye diagrams are swiftly created using the same multi-gigabit/second sampling capability as the BER detection circuit. This provides far more complete characterization of waveform variation with long PRBS or user patterns than existing digital communications analyzers, which are limited to sampling rates below 250 ksamples/second.

Stressed Eye Generation

Mask Test

Stress Generation thumbnail Mask Test thumbnail

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For the first time, eye diagrams give a view of sampled data that is directly correlated to BER measurements. Now, simply adjusting the BERTScope's decision threshold to a mask violation and turning on BitAlyzer® Error Location Analysis™ enables you to easily determine which specific bit and pattern sequence is responsible for an eye diagram mask violation, worst case jitter, or slowest rise time.

BER Contour

Compliance Contour

BER Contour thumbnail Compliance Contour thumbnail

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The BertScope Analyzer with BitAlyzer Error Location Analysis™ performs seven types of advanced error analysis. Use patented Pattern Sensitivity and Error Free Interval Analysis to swiftly identify pattern-dependent and frequency-dependent errors. Proprietary high-resolution (sub-picosecond), self-calibrating delay lines (patent pending) enable accurate measurement and separation of jitter into deterministic and random components through Jitter Peak (jitter bathtub, BERT scan) Analysis, as well as accurate BER Contour Analysis (again correlated with the sample-rich eye diagram display).

Jitter Peak

Jitter Tolerance

Jitter Peak thumbnail Jitter Tol thumbnail

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New high-speed serial interfaces like CEI, XFP/XFI, 10 Gb Ethernet, and both 4 Gb and 10 Gb Fibre Channel are creating new demands for test and detailed performance analysis. SyntheSys Research BERTScope Analyzers feature true differential outputs and inputs with variable decision threshold settings, critical for accurate differential I/O testing and analysis, such as Q-Factor and BER Contour. BERTScopes reduce required capital investments, by simplifying and speeding test and detailed performance analysis with built-in sinusoidal jitter generation and jitter tolerance testing together with integrated stressed eye generation and testing.

Correlation

Q-Factor

Correlation thumbnail Q-Factor thumbnail

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2-D Image Map

Error Free Interval

2-D Image Map Error Free Interval thumbnail

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